Manufacturer Part Number: | STU4N62K3 |
---|---|
Manufacturer: | STMicroelectronics |
Product Category: | Transistors - FETs, MOSFETs - Single |
Available Quantity: | 9028 Pieces |
Unit Price: | Quote by Email |
Description: | MOSFET N-CH 620V 3.8A IPAK |
Lead Free Status / RoHS Status: | Lead free / RoHS Compliant |
Moisture Sensitivity Level (MSL): | 1 (Unlimited) |
Production Status (Lifecycle): | In Production |
Delivery Time: | 1-2 Days |
Date Code (D/C): | New |
Datasheet Download: | STU4N62K3 Datasheet |
Internal Part Number | 898-STU4N62K3 | |
Manufacturer Lead time | 6-8 weeks | |
Condition | New & Unused, Original Sealed | |
Other Related Documents | STU4N62K3 View All Specifications | |
Online Catalog | N-Channel Standard FETs | |
Category | Discrete Semiconductor Products | |
Family | Transistors - FETs, MOSFETs - Single | |
Manufacturer | STMicroelectronics | |
Series | SuperMESH3™ | |
Packaging | Tube | |
Part Status | Active | |
FET Type | MOSFET N-Channel, Metal Oxide | |
FET Feature | Standard | |
Drain to Source Voltage (Vdss) | 620V | |
Current - Continuous Drain (Id) @ 25°C | 3.8A (Tc) | |
Rds On (Max) @ Id, Vgs | 2 Ohm @ 1.9A, 10V | |
Vgs(th) (Max) @ Id | 4.5V @ 50µA | |
Gate Charge (Qg) @ Vgs | 22nC @ 10V | |
Input Capacitance (Ciss) @ Vds | 550pF @ 50V | |
Power - Max | 70W | |
Operating Temperature | 150°C (TJ) | |
Mounting Type | Through Hole | |
Package / Case | TO-251-3 Short Leads, IPak, TO-251AA | |
Supplier Device Package | I-Pak | |
Standard Package | 75 | |
Weight | 0.001 KG | |
Application | Email for details | |
Replacement Part | STU4N62K3 | |
Country of Origin | USA / JAPAN / Philippines / Malaysia | |
MOQ | 1 Piece | |
Picture / Image / Photo | Send via email |
STU4N62K3 is in stock for immediate shipping now. We are the distributor of STMicroelectronics all series components. The condition of STU4N62K3 is new and unused, you can buy STU4N62K3 STMicroelectronics with us at a very low price and quick delivery.
Please kindly send us an email if you have any demands for STU4N62K3.
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